To provide a plasma processing device and method for attaining long life improvement in a protected part so as to reduce exchange frequency of the protected part located in the outside of an object to be processed.
In the plasma processing device, a placing part 3 for placing an object S to be processed, and a gas supplying part 2 for supplying gas are provided in a processing chamber 1 the inside of which can be vacuum. The placing part 3 has a mask ring 33 arranged on the perimeter side of the object S to be processed, and the gas supplying section 2 has: a center side opening 22a and a medium opening 22b, located in the upper part of the object S to be processed, and supplying gas for the plasma processing; and a perimeter side opening 22c located in the upper part or outside of a mask ring 33 for supplying gas so as to produce a deposit in the mask ring 33.
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