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Title:
SEMICONDUCTOR INTEGRATED CIRCUIT HAVING PROTECTIVE CIRCUIT AGAINST OVERHEATING
Document Type and Number:
Japanese Patent JP2005347377
Kind Code:
A
Abstract:

To provide a semiconductor integrated circuit which has a protective circuit against overheating that does not malfunction and is capable of setting a desired detection temperature easily.

The semiconductor integrated circuit has the protective circuit against overheating which consists of a temperature monitoring circuit 21 for monitoring the temperature of an IC chip, and a cutoff circuit 20 for stopping the operation of circuits in the IC chip in response to an output signal from the temperature monitoring circuit 21. In the temperature monitoring circuit 21, a first resistance Rs, a plurality of (s) first diodes connected in series, and a first constant current circuit Is are connected in series. The forward direction voltage of the first diodes is put into one input terminal of a differential amplifying circuit 22. Also, a second resistance Rt, a plurality of (t) second diodes connected in series, and a second constant current circuit It are connected in series, and the forward direction voltage of the second diodes is put into the other input terminal of a differential amplifying circuit 22.


Inventors:
MORINO KOICHI
Application Number:
JP2004162941A
Publication Date:
December 15, 2005
Filing Date:
June 01, 2004
Export Citation:
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Assignee:
RICOH KK
International Classes:
H01L27/04; G01K3/00; G01K7/01; H01L21/822; H01L21/8234; H01L27/02; H01L27/06; H02H5/04; H02H7/20; H03K19/003; (IPC1-7): H01L21/822; H01L21/8234; H01L27/04; H01L27/06; H02H7/20; H03K19/003
Domestic Patent References:
JPH109967A1998-01-16
JP2000241252A2000-09-08
JP2001174337A2001-06-29
JP2003294542A2003-10-15
Attorney, Agent or Firm:
Masayuki Watanabe
Masatoshi Isomura