Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
SPECTROSCOPIC MEASUREMENT DEVICE
Document Type and Number:
Japanese Patent JP2013170867
Kind Code:
A
Abstract:

To provide a spectroscopic measurement device capable of acquiring light having a desired wavelength with a high resolution.

A spectroscopic camera 1 comprises: a telecentric optical system 11 on which measuring object light is made incident; a wavelength variable interference filter 5 and a wavelength switching section 12 for taking out light having a predetermined wavelength from the incident light; and an imaging section 13 for receiving the light. The wavelength variable interference filter 5 comprises: a fixed substrate; a movable substrate disposed opposite to the fixed substrate; a fixed reflection film provided on the fixed substrate; a movable reflection film provided on the movable substrate and disposed opposite to the fixed reflection film via a gap between the reflection films; and an electrostatic actuator for changing a gap amount of the gap between the reflection films. The wavelength switching section 12 comprises: a plurality of band-pass filters having transmission wavelength ranges different from one another; and a filter switching circuit 18 for switching among the plurality of band-pass filters disposed in an optical path.


Inventors:
FUNAMOTO TATSUAKI
Application Number:
JP2012033812A
Publication Date:
September 02, 2013
Filing Date:
February 20, 2012
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SEIKO EPSON CORP
International Classes:
G01J3/26; G01J3/36; G02B26/00
Domestic Patent References:
JPH10104070A1998-04-24
JP2006178320A2006-07-06
JPH05223637A1993-08-31
Foreign References:
US20060139780A12006-06-29
US5442438A1995-08-15
EP0638788A11995-02-15
Attorney, Agent or Firm:
Masahiko Ueyanagi
Osamu Suzawa
Kazuhiko Miyasaka