Title:
SURFACE FLAW INSPECTION EQUIPMENT
Document Type and Number:
Japanese Patent JPH07140080
Kind Code:
A
Abstract:
PURPOSE: To provide an equipment for inspecting the flaw on the surface of an object stably at high rate regardless of the irregularities on the surface.
CONSTITUTION: A slit light projector 103 projects a slit light 104 onto an UO steel pipe 101 and an imaging unit 105, located at a different position, picks up the image of the slit light 104 thus obtaining an optical cut image. In this regard, the position 303a of main spot of a cylindrical lens 303 providing the diverging point of the slit light 104 is matched with that 304a of the light receiving lens 304 of the imaging unit 105 when viewed from the breadthwise direction of the slit light 104.
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Inventors:
FUJIKAKE YOUICHI
MICHIOKA TSUTOMU
UEKI KATSUYA
TAKASHIMA KAZUO
MICHIOKA TSUTOMU
UEKI KATSUYA
TAKASHIMA KAZUO
Application Number:
JP29065993A
Publication Date:
June 02, 1995
Filing Date:
November 19, 1993
Export Citation:
Assignee:
NIPPON STEEL CORP
MITSUBISHI ELECTRIC CORP
MITSUBISHI ELECTRIC CORP
International Classes:
G01B11/30; B23K31/00; G01N21/47; G01N21/88; G01N21/89; G01N21/892; G01N21/954; G06T1/00; G06T7/00; (IPC1-7): G01N21/88; B23K31/00; G01B11/30; G01N21/47; G01N21/89; G06T7/00
Attorney, Agent or Firm:
Masuo Oiwa