PURPOSE: To improve one part of a merely and partially functional embedded memory into a smaller size of completely functional embedded memory.

CONSTITUTION: A first and second fuse F1, F2 and a first and second fuse circuit, controlling the conductive state of a transfer gate making an address signal pass and an output signal, are provided. Both output signals of the first and second fuse circuit are the input signal to a logic circuit generating a first and second input signal toward the transfer gate. When the first fuse is burned off, the address signal is forcibly set into a first logic state, and when the second fuse is burned off, the address signal is forcibly set into a second logic state. When both the first and second fuse are not burned off, the address signal passes merely through the transfer gate as it is. In the second example, the first fuse circuit, the second fuse circuit and an inverse step through which the address signal passes are provided with.