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Title:
X-ray fluorescence analyzer and method
Document Type and Number:
Japanese Patent JP6283854
Kind Code:
B2
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Inventors:
Takashi Yamada
Yuichiro Shimizu
Application Number:
JP2016531176A
Publication Date:
February 28, 2018
Filing Date:
May 14, 2015
Export Citation:
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Assignee:
Rigaku Corporation
International Classes:
G01N23/223
Domestic Patent References:
JP201071762A
JP2003202306A
Foreign References:
US20090067573
Attorney, Agent or Firm:
Shuji Sugimoto
Masashi Noda
Kenro Tsutsumi



 
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