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Title:
SYSTEM AND METHOD FOR ELECTRICAL INSPECTION OF FLAT PANEL DISPLAY DEVICE USING CELL CONTACT PROBING PADS
Document Type and Number:
Japanese Patent JP2017096949
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a probe system for facilitating inspection of a device under test comprising a plurality of panels.SOLUTION: A probe system incorporates: a configurable universal probe bar having a plurality of probe blocks comprising a plurality of probe pins positioned to be simultaneously engaged electrically with a plurality of cell contact pads of a plurality of panels of a device under test to deliver a plurality of electrical test signals; and an alignment system configured to align the plurality of probe pins with the plurality of cell contact pads of the plurality of panels of the device under test.SELECTED DRAWING: None

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Inventors:
YUE GORDON
LLOYD RUSSELL JONES
NEIL DANG NGUYEN
KIRAN JITENDRA
KENT NGUYEN
STEVEN AOCHI
Application Number:
JP2016224617A
Publication Date:
June 01, 2017
Filing Date:
November 18, 2016
Export Citation:
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Assignee:
PHOTON DYNAMICS INC
International Classes:
G01R31/28
Domestic Patent References:
JP2001318116A2001-11-16
JP2007285727A2007-11-01
JP2001074778A2001-03-23
JP2007322428A2007-12-13
JP2008122145A2008-05-29
JP2007316022A2007-12-06
JP2005300409A2005-10-27
JP2014106205A2014-06-09
JP2007003517A2007-01-11
Foreign References:
WO2007069818A12007-06-21
US20050253609A12005-11-17
US20130273803A12013-10-17
US4471298A1984-09-11
KR20070074179A2007-07-12
Attorney, Agent or Firm:
Kenji Sugimura
Kenichiro Kataoka
Kiyoshi Shinno



 
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