Title:
試験装置
Document Type and Number:
Japanese Patent JP7385219
Kind Code:
B2
Abstract:
To allow for testing a test piece at a site where the test piece is collected.SOLUTION: A test device 10 comprises: a holding part 15 that holds a test piece 19; a pressing unit 40 that has a spherical surface 44A, and can move the test piece 19 held in the holding part 15 to a pressing position where the spherical surface 44A presses, and to a retreat position where the spherical surface 44A retreats from the test piece 19; and operation units 82 and 83 that make a manual operation of an operator move a pressing part 44 from the retreat position to the pressing position.SELECTED DRAWING: Figure 1
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| JPH08226888 | APPARATUS FOR INSPECTING STRUCTURE |
| WO/2017/025730 | PLANAR TEST SYSTEM |
Inventors:
Risa Ikeno
Kaori Numata
Masatoshi Kubonai
Hideyuki Ishida
Yasutomo Koga
Yoshihiko Arao
Kaori Numata
Masatoshi Kubonai
Hideyuki Ishida
Yasutomo Koga
Yoshihiko Arao
Application Number:
JP2020136278A
Publication Date:
November 22, 2023
Filing Date:
August 12, 2020
Export Citation:
Assignee:
Tokyo Gas Co., Ltd.
National University Corporation Tokyo Institute of Technology
National University Corporation Tokyo Institute of Technology
International Classes:
G01N3/08
Domestic Patent References:
| JP2018059843A | ||||
| JP7029446U | ||||
| JP2004061387A |
Foreign References:
| US6267011 |
Attorney, Agent or Firm:
Patent Attorney Corporation Taiyo International Patent Office