Title:
APPARATUS AND METHOD FOR TESTING MAGNETIC HEAD
Document Type and Number:
WIPO Patent Application WO/2007/148397
Kind Code:
A1
Abstract:
A testing apparatus is provided for testing the electromagnetic conversion
characteristics of a magnetic head by floating a magnetic head (10) from a medium
surface of a recording medium (16) and inspecting the recording/reproducing
characteristics of the magnetic head to the recording medium. The testing apparatus
is provided with a setting section (14) for shifting the magnetic head (10) to
a position for loading the head on the recording medium (16) and to a position retracted
from the loading position, and supporting the head; an electromagnetic wave
generating apparatus (30) for generating electromagnetic waves toward the
magnetic head; and a detector (20) electrically connected to the magnetic head
for detecting an output signal from the magnetic head. Electromagnetic wave
resistance of the magnetic head (10) can be detected by applying electromagnetic
waves to the magnetic head from the electromagnetic wave generating apparatus
(30).
Inventors:
KAWATA HIROYUKI (JP)
Application Number:
PCT/JP2006/312498
Publication Date:
December 27, 2007
Filing Date:
June 22, 2006
Export Citation:
Assignee:
FUJITSU LTD (JP)
KAWATA HIROYUKI (JP)
KAWATA HIROYUKI (JP)
International Classes:
G11B5/455
Foreign References:
| JP2003098211A | 2003-04-03 | |||
| JP2003279612A | 2003-10-02 |
Attorney, Agent or Firm:
WATANUKI, Takao (12-9 Nakagosho 3-chome,Nagano-sh, Nagano 35, JP)
Download PDF:
Previous Patent: ARC EVAPORATION SOURCE AND VACUUM EVAPORATION SYSTEM
Next Patent: RESIN-SEALED MODULE, OPTICAL MODULE AND METHOD OF RESIN SEALING
Next Patent: RESIN-SEALED MODULE, OPTICAL MODULE AND METHOD OF RESIN SEALING