Title:
CONTROL DEVICE, SYSTEM, METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/176330
Kind Code:
A1
Abstract:
The present invention provides a control device, a system, a method, and a program that make it possible to efficiently acquire data significant for identifying the structure of a macromolecule in a solution with a resolution greater than 30 Å. Provided is a control device 200 for controlling an X-ray analysis device, comprising: a data conversion unit 223 that converts, into profiles, sample solution data and reference solution data acquired from the X-ray analysis device at different points in time; a first indicator calculation unit 232 that calculates a first indicator representing fluctuation of intensity in the time axis direction on the basis of the profile of at least one of the sample solution data and the reference solution data out of the profiles obtained through the conversion; a first indicator determination unit 234 that determines whether or not the calculated first indicator is within a predetermined range; and a device control unit 268 that terminates the measurement by the X-ray analysis device if the first indicator is not within the predetermined range.
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Inventors:
SATO TAKASHI
MATSUMOTO TAKASHI
HASEGAWA TOMOKAZU
MATSUMOTO TAKASHI
HASEGAWA TOMOKAZU
Application Number:
PCT/JP2023/006168
Publication Date:
September 21, 2023
Filing Date:
February 21, 2023
Export Citation:
Assignee:
RIGAKU DENKI CO LTD (JP)
International Classes:
G01N23/20
Foreign References:
| US20200256811A1 | 2020-08-13 | |||
| JP2019056587A | 2019-04-11 | |||
| JP2018084447A | 2018-05-31 | |||
| JP2022019115A | 2022-01-27 | |||
| US20150233804A1 | 2015-08-20 |
Attorney, Agent or Firm:
FUKUCHI Takeo (JP)
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