Title:
DEFECT DETECTION SYSTEM, METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2024/055796
Kind Code:
A1
Abstract:
Embodiments of the present application relate to the technical field of machine vision, and provide a defect detection system, method and apparatus, an electronic device, and a storage medium. In the system, a proximity sensor sends a sensing signal to a control apparatus whenever a product object approaches; the control apparatus receives the sensing signal, encodes the product object to obtain encoding information, and sends a trigger signal to a light detection apparatus; in response to the trigger signal, the light detection apparatus controls a first camera and a second camera to photograph first images and second images; the control apparatus receives each first image and each second image; and for each piece of encoding information, a first image and a second image containing the product object indicated by the encoding information are selected according to a predetermined image selection mode, product object defect detection processing is performed on the selected first image and the selected second image, and a product object defect detection result indicated by the encoding information is determined. Therefore, the system can improve the accuracy of the product object defect detection result.
Inventors:
DU KAIFENG (CN)
Application Number:
PCT/CN2023/113105
Publication Date:
March 21, 2024
Filing Date:
August 15, 2023
Export Citation:
Assignee:
HANGZHOU HIKROBOT CO LTD (CN)
International Classes:
G06T7/00; G06N3/04; G06N3/08
Domestic Patent References:
| WO2012125526A1 | 2012-09-20 |
Foreign References:
| CN115423785A | 2022-12-02 | |||
| CN110487807A | 2019-11-22 | |||
| CN111999308A | 2020-11-27 | |||
| CN113820326A | 2021-12-21 | |||
| CN113436180A | 2021-09-24 |
Attorney, Agent or Firm:
PATENTSINO IP FIRM (CN)
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