Title:
FAULT PROCESSING METHOD, FAULT PROCESSING SYSTEM, FAULT PROCESSING DEVICE AND FAULT PROCESSING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2012/026035
Kind Code:
A1
Abstract:
The fault processing system of the present invention is provided with: a store location information acquisition unit (31) for acquiring store location information representing a store location of fault information generated at fault occurrence time from a storage unit (241) of a component wherein a fault has occurred (24); a fault information acquisition unit (32) for acquiring fault information related to the fault which was generated at an information processing device (20) at fault occurrence time, from a storage device (11) connected so as to be capable of communication with the information processing device (20) and a fault processing device (30), on the basis of the store location information; and a configuration control unit (34) for modifying the configuration of the fault processing device (30) in accordance with the information processing device (20) on the basis of the acquired fault information. Thereby, the fault processing system can easily reproduce a fault that occurs in the information processing device so as to efficiently carry out a reproduction experiment.
Inventors:
OKANO KENJI (JP)
Application Number:
PCT/JP2010/064605
Publication Date:
March 01, 2012
Filing Date:
August 27, 2010
Export Citation:
Assignee:
FUJITSU LTD (JP)
OKANO KENJI (JP)
OKANO KENJI (JP)
International Classes:
G06F11/22
Domestic Patent References:
| WO2007088575A1 | 2007-08-09 |
Foreign References:
| JP2004070859A | 2004-03-04 | |||
| JP2009020799A | 2009-01-29 | |||
| JP2001005697A | 2001-01-12 | |||
| JP2009140136A | 2009-06-25 | |||
| JPH06139093A | 1994-05-20 | |||
| JPH01177642A | 1989-07-13 |
Attorney, Agent or Firm:
SANADA, Tamotsu et al. (JP)
Sanada 有 (JP)
Sanada 有 (JP)
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Claims: