Title:
FOREIGN MATTER INSPECTION DEVICE, FOREIGN MATTER INSPECTION METHOD, AND FOREIGN MATTER INSPECTION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2015/136598
Kind Code:
A1
Abstract:
A foreign matter inspection device for inspecting foreign matter adhered to a sheet in a state in which a recess is formed on the sheet and a tablet is accommodated inside the recess, the foreign matter inspection device having an acquisition unit for acquiring a reflection image obtained by irradiating reflection light onto one surface of the sheet and imaging the reflection light and a transmission image obtained by irradiating transmission light onto the other surface of the sheet and imaging the transmission light and a determination unit for determining, if a foreign matter candidate that is either like matter that is of the same type as the tablet or foreign matter appears in the reflection image and the transmission image, whether the foreign matter candidate is like matter or foreign matter on the basis of the position of the foreign matter candidate appearing in the reflection image and transmission image and the color of the foreign matter candidate appearing in the reflection image.
Inventors:
NARASAKO YUUSUKE (JP)
SATOU YOSHITAKA (JP)
TAKAHASHI MITSUNORI (JP)
SATOU YOSHITAKA (JP)
TAKAHASHI MITSUNORI (JP)
Application Number:
PCT/JP2014/056179
Publication Date:
September 17, 2015
Filing Date:
March 10, 2014
Export Citation:
Assignee:
TOSHIBA KK (JP)
TOSHIBA SOLUTIONS CORP (JP)
TOSHIBA SOLUTIONS CORP (JP)
International Classes:
G01N21/892; G01N21/85
Domestic Patent References:
| WO1998058241A1 | 1998-12-23 |
Foreign References:
| JP2000171410A | 2000-06-23 | |||
| JP2007033339A | 2007-02-08 |
Attorney, Agent or Firm:
AKAZAWA, HIDEO (JP)
Hideo Akazawa (JP)
Hideo Akazawa (JP)
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