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Title:
FRACTURE SURFACE INSPECTION METHOD AND FRACTURE SURFACE INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/039049
Kind Code:
A1
Abstract:
The respective image data of a first contour (rod-side contour (31)), which is a contour of a first fracture surface, and a second contour (cap-side contour (32)), which is a contour of a second fracture surface, are obtained from respective two-dimensional image data of each fracture surface, correction amounts for correcting the respective image data of the first and second contours are calculated such that the respective image data of the first and second contours match image data of a prescribed base contour, and on the basis of the respective correction amounts, the respective three-dimensional image data of each fracture surface are corrected, first and second corrected image data (rod-side and cap-side corrected images (41, 42)) are acquired, and the first corrected image data and the second corrected image data are compared to determine whether each fracture surface is of good quality.

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Inventors:
MURAKAMI RYOSUKE (JP)
Application Number:
PCT/JP2021/029265
Publication Date:
February 24, 2022
Filing Date:
August 06, 2021
Export Citation:
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Assignee:
YASUNAGA KK (JP)
International Classes:
G01B11/25
Foreign References:
JP2017211195A2017-11-30
JP2012073142A2012-04-12
JP6591131B12019-10-16
JP2006269710A2006-10-05
JP2016170624A2016-09-23
Attorney, Agent or Firm:
MAEDA & PARTNERS (JP)
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