Title:
ION ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/152806
Kind Code:
A1
Abstract:
This ion analysis device analyzes product ions generated by irradiating precursor ions derived from a sample component with radicals, the ion analysis device being provided with: reaction chambers (2; 833) to which the precursor ions are introduced; a radical generation unit (5) that generates radicals from a first raw material gas; a meta-stable particle generation unit (5) that generates meta-stable particles from a second raw material gas; a radical introducing unit (5) that mixes the radicals and the meta-stable particles and introduces the resultant mixture into the reaction chambers (2; 833); and ion detecting units (4; 835) that detects the product ions generated from the precursor ions by the introduction of the radicals.
Inventors:
TAKAHASHI HIDENORI (JP)
Application Number:
PCT/JP2019/002069
Publication Date:
July 30, 2020
Filing Date:
January 23, 2019
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
H01J49/04
Domestic Patent References:
| WO2015133259A1 | 2015-09-11 | |||
| WO2018186286A1 | 2018-10-11 |
Foreign References:
| JP2011504642A | 2011-02-10 |
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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