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Title:
MEASUREMENT DEVICE FOR OPTICAL ANALYSIS
Document Type and Number:
WIPO Patent Application WO/2013/183290
Kind Code:
A1
Abstract:
Provided is a measurement device for optical analysis that allows measurement under optimal conditions and whilst being highly precise can be manufactured with comparative ease and at a comparatively low cost. The measurement device for optical analysis according to the present invention comprises a first flat plate (111) and a second flat plate (112), and a silica glass part (300) comprising silica glass chips (301, 302). Also included in the measurement device for optical analysis is the silica glass chip (301) that is attached to the first flat plate (111), the silica glass chip (302) that is attached to the second flat plate (112), and a channel (240) that passes through the silica glass chips (301, 302) from the first flat plate (111) and the second flat plate (112).

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Inventors:
ARAI SUSUMU (JP)
TOYA EIICHI (JP)
NAKANISHI HIDEO (JP)
GOTO HIROYUKI (JP)
Application Number:
PCT/JP2013/003532
Publication Date:
December 12, 2013
Filing Date:
June 05, 2013
Export Citation:
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Assignee:
SUMITOMO BAKELITE CO (JP)
COVALENT MATERIALS CORP (JP)
International Classes:
G01N21/05; G01N37/00
Foreign References:
JP2001004532A2001-01-12
JP2006133030A2006-05-25
JP2006084210A2006-03-30
Attorney, Agent or Firm:
CREIA IP ATTORNEYS (JP)
Patent business corporation クレイア patent firm (JP)
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