Title:
MEASUREMENT INSTRUMENT MOUNTING ASSIST DEVICE AND MEASUREMENT INSTRUMENT MOUNTING ASSIST METHOD
Document Type and Number:
WIPO Patent Application WO/2018/186363
Kind Code:
A1
Abstract:
The present invention addresses the problem of providing a device and method for assisting easy and precise mounting of a measurement instrument, such as a probe, at a designated position on a subject. In order to solve the problem, the present invention provides a measurement instrument mounting assist device 1 comprising: a coordinate detection unit 4 for detecting the coordinates of a predetermined feature point from an image obtained by imaging a subject; a transformation parameter calculation unit 5 for calculating a projection transformation parameter for transforming the coordinates of the feature point in a model image into the coordinates obtained by the detection; a designation unit 7 for designating, in the model image, the position of a measurement instrument to be mounted to the subject; a coordinate transformation unit 6 for using the projection transformation parameter to transform coordinates of the position designated by using the designation unit 7; and a display unit 8 for displaying, on the image obtained by the imaging, the coordinates obtained by the transformation performed by the coordinate transformation unit 6.
Inventors:
KAWAGUCHI HIROSHI (JP)
YAMADA TORU (JP)
YAMADA TORU (JP)
Application Number:
PCT/JP2018/014158
Publication Date:
October 11, 2018
Filing Date:
April 02, 2018
Export Citation:
Assignee:
AIST (JP)
International Classes:
A61B10/00; A61B5/1455; G06T7/00; G06T7/33
Domestic Patent References:
| WO2014184904A1 | 2014-11-20 |
Foreign References:
| JP2014030621A | 2014-02-20 | |||
| JP2006320425A | 2006-11-30 | |||
| JP2017038878A | 2017-02-23 | |||
| JP2010502343A | 2010-01-28 |
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