Title:
METHOD FOR INSPECTING ELECTRONIC DEVICE AND ELECTRONIC DEVICE INSPECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2012/172938
Kind Code:
A1
Abstract:
Provided is a method for inspecting an electronic device, in which an inspection of electrical characteristics is carried out by using a conduction means to pass a current to an electronic device while the electronic device is being continuously conveyed.
Inventors:
ARITA HIROAKI (JP)
MASUDA OSAMU (JP)
MASUDA OSAMU (JP)
Application Number:
PCT/JP2012/063126
Publication Date:
December 20, 2012
Filing Date:
May 23, 2012
Export Citation:
Assignee:
KONICA MINOLTA HOLDINGS INC (JP)
ARITA HIROAKI (JP)
MASUDA OSAMU (JP)
ARITA HIROAKI (JP)
MASUDA OSAMU (JP)
International Classes:
H05B33/12; G01R31/00; G01R31/01; H01L31/04; H01L51/50
Domestic Patent References:
| WO2009050803A1 | 2009-04-23 |
Foreign References:
| JP2005233788A | 2005-09-02 | |||
| JP2007012357A | 2007-01-18 | |||
| JP2005134421A | 2005-05-26 | |||
| JPH0262972A | 1990-03-02 | |||
| JP2000241495A | 2000-09-08 |
Other References:
See also references of EP 2723147A4
Attorney, Agent or Firm:
KOYO INTERNATIONAL PATENT FIRM (JP)
Patent business corporation Mitsuaki international patent firm (JP)
Patent business corporation Mitsuaki international patent firm (JP)
Download PDF:
Claims:
Previous Patent: WIRING BODY AND METHOD FOR MAKING WIRING BODY
Next Patent: ELECTRONIC COMPONENT AND METHOD FOR MANUFACTURING SAME
Next Patent: ELECTRONIC COMPONENT AND METHOD FOR MANUFACTURING SAME