Title:
METHOD FOR MANUFACTURING LAYERED FILM AND VACUUM-PROCESSING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2013/179574
Kind Code:
A1
Abstract:
[Problem] To provide a technique by which high-processing efficiency can be obtained when a layered film, in which eight or more layers of a metal layer and a metal oxide layer are layered together, is manufactured. [Solution] A plurality of processing modules (PM) and wafer conveyance mechanisms (3) are arrayed between load-lock chambers (LL1, LL2). A wafer conveyance mechanism (3) is provided for transferring a wafer (W) from the load-lock chamber (LL1) to the upstream-end processing module (PM1), and a wafer conveyance mechanism (3) is provided for transferring the wafer (W) from the lower-end processing module (PM13) to the load-lock chamber (LL2). The processing modules include a plurality of processing modules for forming a metal film by sputtering on the wafer (W), and a processing module for oxidizing a metal film. Processing is carried out while the wafer (W) is transferred to the downstream side from the load-lock chamber (LL1) toward the load-lock chamber (LL2), whereby a layered film having eight or more layers can be manufactured using a single apparatus, and high-processing efficiency can be ensured.
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Inventors:
GOMI ATSUSHI (JP)
MIYASHITA TETSUYA (JP)
FURUKAWA SHINJI (JP)
MAEDA KOJI (JP)
HARA MASAMICHI (JP)
MIZUSAWA YASUSHI (JP)
MIYASHITA TETSUYA (JP)
FURUKAWA SHINJI (JP)
MAEDA KOJI (JP)
HARA MASAMICHI (JP)
MIZUSAWA YASUSHI (JP)
Application Number:
PCT/JP2013/002887
Publication Date:
December 05, 2013
Filing Date:
April 30, 2013
Export Citation:
Assignee:
TOKYO ELECTRON LTD (JP)
International Classes:
C23C14/34; C23C14/06; H01L21/31; H01L21/316; H01L21/677; H01L21/8246; H01L27/105; H01L43/12
Domestic Patent References:
WO2009060540A1 | 2009-05-14 |
Foreign References:
JP2012039075A | 2012-02-23 |
Attorney, Agent or Firm:
INOUE, TOSHIO (JP)
Toshio Inoue (JP)
Toshio Inoue (JP)
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