OPERATION TESTING DEVICE FOR ELECTRONIC DEVICE, OPERATION TESTING METHOD, AND METHOD FOR PRODUCING ELECTRONIC DEVICE

WIPO Patent Application WO/2012/141021

A1

[Problem] To provide an operation testing device whereby it is possible to measure electrical characteristics while cooling a measurement subject such as an electronic device, without the use of a conventional cooling device. [Solution] An operation testing device (1) has: a receptacle (10) for storing a coolant (3); a coolant discharge line (4) for causing the coolant (3) in the receptacle (10) to outflow to the outside of the receptacle (10), as well as causing the coolant (3) that has outflowed to again inflow into the receptacle (10); a pump (30); a heat exchange line (5); a radiator (22) of a heat exchanger (20); and a closed-path circulation line constituted by a coolant supply line (6). Within the receptacle (10) is formed an accommodating space wherein it is possible for an electronic device (2) that emits heat when running to be run while immersed in the stored coolant (3), thereby making it possible to measure the electrical characteristics of the electronic device (2) while running. The heat exchanger (20), which cools an inert liquid flowing through the closed-path circulation line, is interposed in proximity to the closed-path circulation line.

MURASAWA OSAMU (JP)
TAMURA TETSUJI (JP)

PCT/JP2012/058847

October 18, 2012

April 02, 2012

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SONY COMPUTER ENTERTAINMENT INC (JP)
MURASAWA OSAMU (JP)
TAMURA TETSUJI (JP)

G01R31/26; G01R29/08; H01L21/66

JPH03195038A	1991-08-26
JP2007095932A	2007-04-12
JPH03241851A	1991-10-29
JPH05288800A	1993-11-02

SUZUKI, Seigoh (JP)
Masatake Suzuki (JP)

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