Title:
PROBE PIN AND INSPECTION DEVICE USING SAME
Document Type and Number:
WIPO Patent Application WO/2017/141564
Kind Code:
A1
Abstract:
This probe pin comprises an insulating elastic member (11), a first plunger (20) and a second plunger (40). The first plunger (20) and the second plunger (40) respectively comprise fist conductors (30, 50) and second conductors (35, 55) that are positioned in parallel in the thickness direction, and insulators (38) that are positioned between the first conductors (30, 50) and second conductors (35, 55). A first conductive path is provided between the first conductor (30) of the first plunger (20) and the first conductor (50) of the second plunger (40), and a second conductive path that is electrically independent of the first conductive path is provided between the second conductor (35) of the first plunger (20) and the second conductor (55) of the second plunger (40).
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Inventors:
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
SAKAI TAKAHIRO (JP)
Application Number:
PCT/JP2017/000302
Publication Date:
August 24, 2017
Filing Date:
January 06, 2017
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; G01R1/073
Domestic Patent References:
| WO2013051675A1 | 2013-04-11 | |||
| WO2008133209A1 | 2008-11-06 |
Foreign References:
| JP2010539672A | 2010-12-16 | |||
| JP2005221309A | 2005-08-18 | |||
| JP2010117268A | 2010-05-27 | |||
| JP2012220451A | 2012-11-12 |
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
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