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Title:
QUALITY EVALUATION METHOD AND QUALITY EVALUATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/224414
Kind Code:
A1
Abstract:
This quality evaluation device 10: detects a defect present in a component X on the basis of a detection result obtained by a nondestructive inspection method; extracts a feature amount of the defect from detection information about the defect; specifies a part E to be evaluated at which the defect is present in the component X; acquires one or multiple use state information values associated with the part E to be evaluated, the state information values being prediction values that indicate the physical characteristics of the part E to be evaluated when the component X is used; and determines, on the basis of at least a feature amount and the use state information values, whether the defect is a failure defect.

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Inventors:
TERAGUCHI TAKEHITO (JP)
KASAI HIROSHI (JP)
TAKAYAMA YUSUKE (JP)
Application Number:
PCT/JP2021/016345
Publication Date:
October 27, 2022
Filing Date:
April 22, 2021
Export Citation:
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Assignee:
NISSAN MOTOR (JP)
International Classes:
G01N23/18; G01N23/04
Foreign References:
JP2006189349A2006-07-20
JP2005156305A2005-06-16
JP2006170922A2006-06-29
US9038470B12015-05-26
US20090066939A12009-03-12
JP2006105794A2006-04-20
Attorney, Agent or Firm:
TOKOSHIE PATENT FIRM (JP)
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