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Patent Searching and Data


Title:
RELIABILITY ASSESSMENT DEVICE AND RELIABILITY ASSESSMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/194509
Kind Code:
A1
Abstract:
The present invention is provided with: a training data storage unit (102) for storing training data items comprising sets of data items and labels that are information items related to the data items and that are assigned for identifying objects to be identified; a learning unit (103) that, after applying a preset dropout parameter to a neural network model to be learned so as to perform a dropout process thereon, repeats learning for classifying the plurality of labels by using the training data items, the repeated learning being performed until the learning is converged; a model reconfiguration unit (105) for reconfiguring, in accordance with the dropout parameter, a learned model that is the neural network model obtained by having the repeated learning converged and for creating a plurality of different reconfiguration models; an identification unit (107) that identifies the training data items by using the created reconfiguration models and deduces the respective labels of the reconfiguration models; and a classification determination unit (109) that, on the basis of the deduction labels having been deduced, assesses the respective labels of the training data items and classifies the labels of the training data items.

Inventors:
FUJINO TOMOYA (JP)
Application Number:
PCT/JP2019/012877
Publication Date:
October 01, 2020
Filing Date:
March 26, 2019
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G06N3/08
Foreign References:
JP2018045483A2018-03-22
JP2015079308A2015-04-23
JP2018106463A2018-07-05
JP2018045483A2018-03-22
Other References:
GAL, YARIN: "Dropout as a Bayesian Approximation: Representing Model Uncertainty in Deep Learning", ARXI V, 4 October 2016 (2016-10-04), XP055467519, Retrieved from the Internet > [retrieved on 20190624]
MAKOTO SATOH, PICTORIAL SYMBOLS, vol. 2016 -CG, no. 3, 1 February 2016 (2016-02-01), pages 1 - 8, XP055744389, ISSN: 2188-8949, Retrieved from the Internet > [retrieved on 20190624]
C. M. BISHOPHIROSHI MOTODA: "Pattern Recognition and Machine Learning; First Volume", ASAKURA PUBLISHING CO., LTD., pages: 174 - 175,450-451
See also references of EP 3926545A4
Attorney, Agent or Firm:
TAZAWA, Hideaki et al. (JP)
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