Title:
STRUCTURE CONDITION ASSESSING DEVICE, CONDITION ASSESSING SYSTEM, AND CONDITION ASSESSING METHOD
Document Type and Number:
WIPO Patent Application WO/2017/179535
Kind Code:
A1
Abstract:
The objective of the present invention is to make it possible to carry out accurate categorized detection of defects in a structure, such as cracking, detachment or internal voids, remotely and in a non-contact manner. The condition assessing device of the present invention comprises: a displacement calculating unit which calculates, from differences between images of a structure surface captured at a first imaging distance and a second imaging distance, a two-dimensional spatial distribution of displacements in the images, and which calculates, from an image of the structure surface prior to application of a load, captured at the first imaging distance, and differences between said image and time-series images of the structure surface resulting from the application of the load, a two-dimensional spatial distribution of displacements in the time-series images; a depth movement amount calculating unit which calculates the first imaging distance from the two-dimensional spatial distribution of the displacements between the images, and uses the first imaging distance to calculate an amount of movement of the structure surface, in the direction of a normal line thereto, resulting from the application of the load, from the two-dimensional spatial distribution of the displacements in the time-series images; a displacement separating unit which separates the two-dimensional spatial distribution of the displacements of the structure surface by calculating a correction amount on the basis of the amount of movement, and subtracting the correction amount from the two-dimensional spatial distribution of the displacements in the time-series images; and an abnormality assessing unit which identifies defects in the structure on the basis of a comparison between the two-dimensional spatial distribution of the displacements of the structure surface and the movement amount, and thresholds relating to the spatial distribution of the displacements and to the movement amount, provided in advance.
Inventors:
IMAI HIROSHI (JP)
Application Number:
PCT/JP2017/014667
Publication Date:
October 19, 2017
Filing Date:
April 10, 2017
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01B11/30; G01B11/16; G01M99/00; G01N21/88
Domestic Patent References:
| WO2016047093A1 | 2016-03-31 |
Foreign References:
| JP2007240218A | 2007-09-20 | |||
| JP2007057386A | 2007-03-08 | |||
| CN102359966A | 2012-02-22 |
Other References:
HIROSHI IMAI ET AL.: "In-plane/out-of-plane displacement separation in structural internal deterioration detection with monocular motion vector field analysis", T HE INSTITUTE OF ELECTRONICS , INFORMATION AND COMMUNICATION ENGINEERS 2015 NEN ENGINEERING SCIENCES SOCIETY/NOLTA SOCIETY TAIKAI KOEN RONBUNSHU, 25 August 2015 (2015-08-25)
Attorney, Agent or Firm:
SHIMOSAKA Naoki (JP)
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