Title:
SUBSTANCE PROPERTIES MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2013/147038
Kind Code:
A1
Abstract:
A substance properties measuring device for irradiating light of different wavelengths onto a substance to be measured and measuring the properties of the substance to be measured on the basis of the relative intensity of light of each wavelength that has been irradiated onto the substance to be measured, wherein high-precision measurement can be carried out even when the half-value width of the spectrum is not very narrow light. A substance properties measuring device characterized in comprising: a light source irradiation unit for irradiating light having n different wavelengths onto a substance to be measured; a detection unit for detecting the intensity of light of each wavelength that has been irradiated onto the substance to be measured; and a computation processing unit for correcting the intensity of light of at least a portion of the wavelengths of the detected wavelengths using correction coefficients expressed in a matrix in which the rows and columns are an nth order or less, and computing an index value that indicates the properties of the substance to be measured on the basis of the relative intensity of light of each wavelength thus corrected.
Inventors:
ICHIZAWA YASUSHI (JP)
HORIKOSHI KUMIKO (JP)
SETSUDA KAZUKI (JP)
CHIDA NAOMICHI (JP)
HORIKOSHI KUMIKO (JP)
SETSUDA KAZUKI (JP)
CHIDA NAOMICHI (JP)
Application Number:
PCT/JP2013/059298
Publication Date:
October 03, 2013
Filing Date:
March 28, 2013
Export Citation:
Assignee:
YOKOGAWA ELECTRIC CORP (JP)
International Classes:
G01N21/35
Foreign References:
| JP2004163312A | 2004-06-10 | |||
| JP2012026746A | 2012-02-09 | |||
| JPH0587733A | 1993-04-06 |
Attorney, Agent or Firm:
Shin-Ei Patent Firm, P. C. (JP)
Patent business corporation Shin-Ei Patent Firm (JP)
Patent business corporation Shin-Ei Patent Firm (JP)
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