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Title:
TEST CARRIER
Document Type and Number:
WIPO Patent Application WO/2011/048834
Kind Code:
A1
Abstract:
A test carrier (10) comprises a base member (20A) and a cover member (50A), which sandwich a die (90). A base film (40) of the base member (20A) has a preformed first circuit pattern (41) and a printing region (22), wherein a second circuit pattern (44) is to be formed by printing, and the second circuit pattern (44) is electrically connected to the first circuit pattern (41).

More Like This:
JPS6136950MANUFACTURE OF SEMICONDUCTOR DEVICE
JPH0518906METHOD FOR DETECTING RECESSED PART OF MATERIAL UNDER INSPECTION
Inventors:
NAKAMURA KIYOTO (JP)
KOGURE YOSHINARI (JP)
Application Number:
PCT/JP2010/057898
Publication Date:
April 28, 2011
Filing Date:
May 10, 2010
Export Citation:
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Assignee:
ADVANTEST CORP (JP)
NAKAMURA KIYOTO (JP)
KOGURE YOSHINARI (JP)
International Classes:
H01L21/60; G01R31/26
Foreign References:
JPH1068758A1998-03-10
JP2003344484A2003-12-03
JPH07201429A1995-08-04
Attorney, Agent or Firm:
TOKOSHIE PATENT FIRM (JP)
It can exceed and is a patent business corporation. (JP)
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