MS/MS-TYPE MASS SPECTROMETRY METHOD AND MS/MS-TYPE MASS SPECTROMETER

Title:

MS/MS-TYPE MASS SPECTROMETRY METHOD AND MS/MS-TYPE MASS SPECTROMETER

Document Type and Number:

WIPO Patent Application WO/2015/193946

Kind Code:

A1

Abstract:

In the present invention, when performing MS/MS analysis of a polyvalent ion derived from a target component, when an analyzer inputs, via an input unit (20), the mass value (mLoss) of detached fragments and at least two values among the valence (zLoss) of detached fragments, the valence (zPrec) of precursor ions, and the valence (zProd) of product ions, a valence calculation unit (221) calculates the non-input valence (zprec or zProd) on the basis of the relationship zPrec = zProd+zLoss. When MS/MS analysis starts, a precursor ion m/z setting unit (222) sets the m/z = MPrec of the ions passing through an initial quadrupole mass filter (13), a pass-through product ion m/z calculation unit (223) applies the MProd, mLoss zPrec, and zProd to the relational formula MProd = (MPrec×zPrec-mLoss)/zProd, and calculates m/z = MProd of the product ions passed through the initial quadrupole mass filter (16). As a result, even if the detached fragments are not neutral, it is possible to investigate pairs of precursor ions and product ions resulting in specific charged fragments having a mass of mLoss and a valence of zLoss detaching.

Inventors:

UMEMURA YOSHIKATSU (JP)

Application Number:

PCT/JP2014/065905

Publication Date:

December 23, 2015

Filing Date:

June 16, 2014

Export Citation:

Click for automatic bibliography generation Help

Assignee:

SHIMADZU CORP (JP)

International Classes:

H01J49/42

Domestic Patent References:

WO2010089798A1

2010-08-12

Foreign References:

JP2012159336A	2012-08-23
JP2012138270A	2012-07-19

Other References: