Title:
WAVEFORM MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2021/093579
Kind Code:
A1
Abstract:
A waveform measuring method, comprising: first convert a waveform to be measured into two corresponding square waves by means of two comparators; collect the two square waves after a hardware logic device receives a signal of starting to collect the waveform sent from upper computer software (S101); meanwhile, start a counter to count at a constant high-frequency clock (S102); when waveform flipping occurs, if a count value is less than a set filtering value, filter the waveform; if the count value is greater than the set filtering value, a hardware logic device stores the current waveform and the count value, resets the counter to be zero, and then determines whether the number of waveform flipping times reaches a set value (S104); if the number of waveform flipping times does not reach the set value, count again; if the number of waveform flipping times reaches the set value, stop collecting the waveform; then, read the waveform and the count value stored by the hardware logic device by means of the upper computer software, and perform optimization; substitute the waveform into a corresponding algorithm according to test requirements; output the calculation result. The accuracy and precision of the measurement are improved, and the flexibility of the measuring method is improved.
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Inventors:
HUANG YUEYANG (CN)
MAO GUOLIANG (CN)
MAO GUOLIANG (CN)
Application Number:
PCT/CN2020/124070
Publication Date:
May 20, 2021
Filing Date:
October 27, 2020
Export Citation:
Assignee:
NANJING MACROTEST SEMICONDUCTOR TECH CO LTD (CN)
International Classes:
G01R13/00; G01R23/10; H03K5/1252
Domestic Patent References:
| WO2017089856A1 | 2017-06-01 |
Foreign References:
| CN110806501A | 2020-02-18 | |||
| CN105044420A | 2015-11-11 | |||
| CN101871968A | 2010-10-27 | |||
| CN105698663A | 2016-06-22 | |||
| US9797957B2 | 2017-10-24 | |||
| US20140029714A1 | 2014-01-30 |
Other References:
JIE GUANGWEN: "The Module Design of Digital Phosphor Oscilloscope Waveform Analysis and Waveform Feature Search", CHINA MASTER’S THESES FULL-TEXT DATABASE, 20 April 2017 (2017-04-20), pages 1 - 89, XP055812884, ISSN: 1674-0246
Attorney, Agent or Firm:
BEIJING LAWSING IP FIRM (CN)
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