Title:
【発明の名称】組織を分析する方法および装置
Document Type and Number:
Japanese Patent JP2820440
Kind Code:
B2
Abstract:
In the texture analysis of rolled sheets and strips with the aid of X-rays or gamma rays which penetrate the same, the total beam of a radiation source is split by collimators into a plurality of sub-beams, and each sub-beam is directed at a different angle onto a sub-area of the strip or sheet to be examined. The diffracted radiation which has passed through the sheet is analysed in detectors according to the energy distribution, and the values are assigned in a computer to textures, the computer containing in its program a computational formula specified by Bunge and Wang in the book "Theoretical Methods of Texture Analysis", edition 1987, pages 163 to 173.
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Inventors:
Hermann-Joseph Kopinetsk
Heiner Otten
Hans-Joachim Bunge
Heiner Otten
Hans-Joachim Bunge
Application Number:
JP19442389A
Publication Date:
November 05, 1998
Filing Date:
July 28, 1989
Export Citation:
Assignee:
Hetshyu, Shuttar, Actien Gezershyaft
International Classes:
G01N23/16; G01N23/20; (IPC1-7): G01N23/20
Domestic Patent References:
| JP517982A | ||||
| JP6135304A | ||||
| JP5023281A |
Other References:
【文献】米国特許4982417(US,A)
【文献】欧州特許352423(EP,B1)
【文献】独国特許3825830(DE,C)
【文献】欧州特許352423(EP,B1)
【文献】独国特許3825830(DE,C)
Attorney, Agent or Firm:
Toshio Yano (1 outside)