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Patent Searching and Data


Title:
磁気力顕微鏡用の磁界発生装置
Document Type and Number:
Japanese Patent JP4354397
Kind Code:
B2
Abstract:
The magnetic field generator device comprises a plurality of magnetic field generator units, which generate distinct magnetic fields in different locations, and at least two or more of these magnetic field generator units have different external shape, configuration or size. The magnetic field formed by such a magnetic field generator device is scanned by the probe device of a magnetic force microscope, and based on the measurement result, the probe device is calibrated.

Inventors:
Yasuhiro Endo
Wakana Shinichi
Application Number:
JP2004375425A
Publication Date:
October 28, 2009
Filing Date:
December 27, 2004
Export Citation:
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Assignee:
富士通株式会社
International Classes:
G01Q30/04; G01Q40/02; G01Q60/50
Other References:
J. Lohau, et al,Quantitative determination of effective dipole and monopole moments of magnetic force microscopy tips,JOURNAL OF APPLIED PHYSICS,米国,American Institute of Physics,1999年 9月15日,Vol. 86, No. 6,p3410 - p3417
Th. Kebe et al.,Calibration of magnetic force microscopy tips by using nanoscale current-carrying parallel wires,JOURNAL OF APPLIED PHYSICS,米国,American Institute of Physics,2004年 2月 1日,Vol. 95, No. 3,p775 - p792
Linshu Kong, et al,Study of magnetic properties of magnetic force microscopy probes using micronscale current rings,J. Appl. Phys,米国,American Institute of Physics,1997年 4月15日,Vol. 81, No. 8,p5026 - p5028
Attorney, Agent or Firm:
Yoshiyuki Osuga
Motoaki Hisagi