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Patent Searching and Data


Title:
X線反射率測定装置
Document Type and Number:
Japanese Patent JP4367820
Kind Code:
B2
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Inventors:
Kawato Seiji
Application Number:
JP2001094136A
Publication Date:
November 18, 2009
Filing Date:
March 28, 2001
Export Citation:
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Assignee:
Rigaku Corporation
International Classes:
G01N23/20
Domestic Patent References:
JP6258259A
JP4218754A
JP2001066398A
JP5322804A
JP2000206059A
JP2000292379A
Attorney, Agent or Firm:
Toshitake Yamamoto



 
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