Title:
セルモジュールアセンブリーの絶縁性検査装置及び方法、並びにそのためのプロブ
Document Type and Number:
Japanese Patent JP5208278
Kind Code:
B2
Abstract:
An apparatus for checking insulation of a cell module assembly composed of a plurality of pouch cells includes a first probing unit electrically contacted to an electrode of the cell module assembly; a second probing unit electrically contacted to aluminum films of selected ones of the pouch cells in the cell module assembly; and a measuring unit for measuring an insulation resistance between the first probing unit and the second probing unit. This apparatus may measure insulation resistances of a plurality of pouch cells of the cell module assembly at once, thereby ensuring faster insulation checking.
Inventors:
Lee, Joo-Seok
Nam Gong, John Yee.
Nam Gong, John Yee.
Application Number:
JP2011530955A
Publication Date:
June 12, 2013
Filing Date:
October 12, 2009
Export Citation:
Assignee:
LG HAUSYS,LTD.
International Classes:
H01M10/48; G01R31/12
Domestic Patent References:
| JP2008243439A | ||||
| JP2005251685A | ||||
| JP2006179372A |
Attorney, Agent or Firm:
Longhua International Patent Service Corporation
Previous Patent: 走査信号線駆動回路およびそれを備えた表示装置
Next Patent: OXIDE DISPERSION REINFORCED PLATINUM AND PLATINUM ALLOY
Next Patent: OXIDE DISPERSION REINFORCED PLATINUM AND PLATINUM ALLOY