Title:
検体分析装置
Document Type and Number:
Japanese Patent JP5898410
Kind Code:
B2
Abstract:
The present invention is a sample analyzer, comprising: an analyzing section for analyzing a sample; a memory for storing analysis results of the sample by the analyzing section and an event history information indicating an event that occurred in the sample analyzer; an input device used to specify an analysis result from a plurality of analysis results stored in the memory; a display; and a controller for acquiring an event history information related to the analysis result specified by the input device from the memory and controlling the display to show information related to a cause of uncertainty of the specified analysis result based on the acquired event history information.
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Inventors:
Inomata Kiichi
Taiki Kano
Taiki Kano
Application Number:
JP2011076083A
Publication Date:
April 06, 2016
Filing Date:
March 30, 2011
Export Citation:
Assignee:
Sysmex Corporation
International Classes:
G01N35/00
Domestic Patent References:
| JP2009216705A | ||||
| JP2004355168A | ||||
| JP2010071647A | ||||
| JP2004271327A | ||||
| JP2009075633A | ||||
| JP2007232510A |
Attorney, Agent or Firm:
Yosuke Koreeda
Toshiyuki Ueda
Toshiyuki Ueda
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