Title:
タンジェンシャルフィルタリングによって抽出された粒子を処理し分析するための方法と装置
Document Type and Number:
Japanese Patent JP6591980
Kind Code:
B2
Abstract:
A filter arrangement with a top element and a bottom element and a filter element therebetween captures oversized particles on the upper surface of the filter element and tangentially rinses these particles using an elution fluid to provide a concentration of particles in a relatively low volume of fluid for further analysis. A configuration using a slider valve may also be utilized. Additionally, an arrangement of supply and receiving containers may be used to minimize the number of containers required. A mass flow meter may be incorporated to measure the flow of elution fluid. Finally, a wash stage of the filtering process may be used to introduce stain onto the particles for further analysis, such as that associated with Gram staining and these stained particles may be further analyzed.
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Inventors:
Garfinkel, Jonathan
Ingbar, Gull
Ingbar, Gull
Application Number:
JP2016536719A
Publication Date:
October 16, 2019
Filing Date:
December 04, 2014
Export Citation:
Assignee:
POCARED DIAGNOSTICS, LTD.
International Classes:
C12M1/26; B03B5/00; G01N1/10; G01N33/48
Foreign References:
| WO2008151093A1 |
Attorney, Agent or Firm:
Patent business corporation r&c