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Title:
APPARATUS AND METHOD FOR GENE DIAGNOSIS
Document Type and Number:
Japanese Patent JP3781686
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide an apparatus and a method of the gene diagnosis capable of detecting the gene abnormality of single nucleotide or more in a short time, easily and accurately, and capable of automating the diagnosis with a reduced size, a reduced weight, a low price and a small running cost.
SOLUTION: In the apparatus of the gene diagnosis, there are filled a separation DNA conjugate in which a first base sequence capable of hydrogen bonding with a DNA sample is coupled with a polymeric compound and the DNA sample is separated to a normal DNA and an abnormal DNA by the difference of bonding strength; a delay DNA conjugate in which a second base sequence is coupled with the polymeric compound and only a noise DNA is differentiated by providing the second base sequence with similar bonding strengths to the normal DNA and the abnormal DNA; and the DNA sample. The DNA sample in a closed flow path is electrophoresed by increasing the absolute value of the voltage and a detecting section measures passing quantities of the normal DNA, the abnormal DNA and the noise DNA, respectively.


Inventors:
西田 毅
橋本 英明
森 一芳
前田 瑞夫
片山 佳樹
Application Number:
JP2002000042925
Publication Date:
May 31, 2006
Filing Date:
February 20, 2002
Export Citation:
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Assignee:
松下電器産業株式会社
前田 瑞夫
片山 佳樹
International Classes:
G01N27/447; G01N33/50; C12M1/00; C12M1/34; C12M1/38; C12M1/42; C12N15/09; C12Q1/68; G01N33/483; (IPC1-7): G01N33/50; C12M1/00; C12Q1/68; G01N27/447; G01N33/483
Domestic Patent References:
JP2001252098A
JP6138090A
JP5332992A
Foreign References:
Attorney, Agent or Firm:
岩橋 文雄
永野 大介
内藤 浩樹