Title:
ARTIFICIAL SIDEROPHORE COMPLEX-MODIFIED FINE PARTICLE AND BASE PLATE FOR SENSOR COATED BY THE FINE PARTICLE
Document Type and Number:
Japanese Patent JP2014181219
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a nano fine particle in which an artificial siderophore complex magnifying sensitivity of a detection method of microorganism by QCM is modified.SOLUTION: There is provided a fine particle a surface of which an artificial siderophore complex having a structure represented by the formula (1) is modified in a molecule. In the formula (1), where Rto Rrepresent each independently an alkyl group having 1 to 6 carbon atoms, an aryl group having 6 to 10 carbon atoms and the like, Rrepresents a nitro group, an amino group and the like, l and m represent each independently a methylene group having 0 to 5 carbon atoms, and Mrepresents trivalent metal ion.
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Inventors:
MASUDA HIDEKI
OZAWA TOMOHIRO
INOMATA TOMOHIKO
MURASE TAKANORI
OZAWA TOMOHIRO
INOMATA TOMOHIKO
MURASE TAKANORI
Application Number:
JP2013057476A
Publication Date:
September 29, 2014
Filing Date:
March 21, 2013
Export Citation:
Assignee:
NAGOYA INST TECHNOLOGY
International Classes:
C07C239/18; C07C323/52; C07F19/00; G01N33/543; C07F1/12; C07F15/02; C12Q1/02