BIDIRECTIONAL SCAN CIRCUIT AND SCAN TEST CIRCUIT

Title:

BIDIRECTIONAL SCAN CIRCUIT AND SCAN TEST CIRCUIT

Document Type and Number:

Japanese Patent JP2004053262

Kind Code:

A

Abstract:

To make a scan path bidirectional and to easily specify a faulty location of the scan path.

First scan data provided for a forward scan-in terminal TI or second scan data provided for a reverse scan-in terminal RSI is selected by a multiplexer 11. After the selected scan data is held at a scan F/F12, the first scan data is outputted to a forward scan-out terminal Q, and the second scan data is outputted to a reverse scan-out terminal RSO.

Inventors:

MORIKAWA NORIYUKI

Application Number:

JP2002206879A

Publication Date:

February 19, 2004

Filing Date:

July 16, 2002

Export Citation:

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Assignee:

TOSHIBA MICRO ELECTRONICS
TOSHIBA CORP

International Classes:

G06F11/22; H01L21/66; H01L21/822; H01L27/04; H03K19/00; H03K19/21; G01R31/28; (IPC1-7): G01R31/28; G06F11/22; H01L21/66; H01L21/822; H01L27/04; H03K19/00; H03K19/21

Attorney, Agent or Firm:

Hidekazu Miyoshi
Yasuo Miyoshi
Iwa Saki Kokuni
Kawamata Sumio
Nakamura Tomoyuki
Masakazu Ito
Shunichi Takahashi
Toshio Takamatsu

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