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Title:
CHARGE BEAM DRAWING DEVICE AND CHARGE BEAM DRAWING METHOD
Document Type and Number:
Japanese Patent JP2001222099
Kind Code:
A
Abstract:

To provide a charge beam drawing device and method therefor which reduce the standby time for maintaining the temperature of a glass substrate 1 at the same temperature as the temperature in a sample chamber 5.

The charge beam drawing device 50 consists of a cassette stocker 2 in which plural glass substrates 1 are housed in a direction where the glass substrates are transported, a spare chamber 12 which internally has a temperature control means 14, an evacuatable load locking chamber 3, a robot chamber 4 which is internally evacuated to a vacuum during the operation of the device and a sample chamber 5 which is internally evacuate to vacuum during the operation of the device and where the glass substrates 1 are subjected to drawing. The sample chamber 5 is internally provided with a stage 10 which may be loaded with the glass substrates 1. The upper part of the sample chamber 5 is provided with an electron gun for emitting an electron beam and a lens barrel 11 having various kinds of apertures, lenses, deflectors, etc., for forming the electron beam to a pattern shape. The temperature of the glass substrates 1 may be rapidly maintained at the same temperature as the temperature in the sample chamber 5 by such constitution of the spare chamber 12.


Inventors:
OGASAWARA MUNEHIRO
SUNAOSHI HITOSHI
HATTORI SEIJI
AKENO MASANOBU
TAKAMATSU JUN
SHIMOMURA NAOHARU
Application Number:
JP2000033268A
Publication Date:
August 17, 2001
Filing Date:
February 10, 2000
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
H01J37/20; G03F1/76; G03F1/78; H01J37/305; H01L21/027; (IPC1-7): G03F1/08; H01J37/20; H01J37/305; H01L21/027
Attorney, Agent or Firm:
Norio Ogo (2 outside)