Title:
光学フィルム及び積層光学フィルムの欠陥検査方法
Document Type and Number:
Japanese Patent JP6641093
Kind Code:
B2
Abstract:
This laminated optical film defect inspecting method includes: a first inspection step of subjecting an optical film 11 to defect inspection; a step of creating a laminated optical film 10A, 10B by bonding a protective film 12 and an adhesive material 13 to the optical film 11; a recording step of recording information relating to defects 20 detected in the first inspection step as codes 40 on the laminated optical film 10A; a second inspection step of subjecting the laminated optical film 10B to defect inspection; and a marking step of marking the laminated optical film 10B corresponding to the defects 20 detected in the first inspection step and defects 21 detected in the second inspection step. In the second inspection step, the defect information recorded in the recording step is read, and the defects 20 corresponding to said defect information are not detected a second time.
Inventors:
Keita Imura
Toshihiko Tominaga
Toshihiko Tominaga
Application Number:
JP2015057729A
Publication Date:
February 05, 2020
Filing Date:
March 20, 2015
Export Citation:
Assignee:
Sumitomo Chemical Co., Ltd.
International Classes:
G01N21/892; G01M11/00; G01N21/896
Domestic Patent References:
| JP2014240816A | ||||
| JP2012173044A | ||||
| JP2009244064A | ||||
| JP2008164336A |
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshinori Shimizu
Takashi Mikami
Yoshinori Shimizu
Takashi Mikami