Title:
劣化判定装置、閾値決定装置、閾値決定方法、および閾値決定プログラム
Document Type and Number:
Japanese Patent JP7098071
Kind Code:
B2
Abstract:
A degradation assessment device (1) is provided with an acquisition unit (10), a selection unit (40), a determination unit (50), and a degradation assessment unit (31). In a threshold value determination mode for determining a threshold value, the selection unit (40) selects, as an extraction range, a range among a plurality of ranges that includes the largest number of measured values, wherein the plurality of ranges are obtained by dividing a numerical value range of from the minimum value to the maximum value among a plurality of measured values that are included in time-series measurement data acquired by the acquisition unit (10). The determination unit (50) determines a threshold value on the basis of the extraction range selected by the selection unit (40) or on the basis of a plurality of measured values included in the extraction range. In a degradation assessment mode for assessing the degradation of a machining facility (2), the degradation assessment unit (31) assesses the degradation of the machining facility (2) on the basis of the time-series measurement data acquired by the acquisition unit (10) and on the basis of the threshold value determined by the determination unit (50).
Inventors:
Kehi Jingu Shrine
Tomohiko Akiyama
Hayashi Isamu
Tomohiko Akiyama
Hayashi Isamu
Application Number:
JP2021558071A
Publication Date:
July 08, 2022
Filing Date:
November 19, 2019
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
G01D1/18; G01M99/00; G05B23/02
Domestic Patent References:
| JP317539A |
Foreign References:
| WO2013153607A1 | ||||
| US20170090445 |
Attorney, Agent or Firm:
Takamura Jun