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Title:
DETERMINATION METHOD, EXPOSURE METHOD, ALIGNER, METHOD OF MANUFACTURING DEVICE, AND PROGRAM
Document Type and Number:
Japanese Patent JP2011138829
Kind Code:
A
Abstract:

To obtain movement order of a substrate stage and scanning directions of respective shots on a substrate that are advantageous in terms of throughput of a scanning aligner.

An initial position of the substrate stage of the scanning aligner, a plurality of measurement positions for measuring a plurality of measurement points on a substrate held by the substrate stage, a plurality of exposure positions for exposing the plurality of shots on the substrate, and the order of sequential movement of a final position of the substrate stage to the substrate stage and the respective scanning directions of the plurality of shots are determined using a solution of a traveling salesman problem formulated under settings of a predetermined node and movement cost.


Inventors:
SHINANO YUJI
TAKAKURA SHIN
FUKAGAWA YOZO
Application Number:
JP2009296367A
Publication Date:
July 14, 2011
Filing Date:
December 25, 2009
Export Citation:
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Assignee:
CANON KK
UNIV TOKYO AGRICULTURE
International Classes:
H01L21/027; G03F7/20; H01L21/68
Attorney, Agent or Firm:
Yasunori Otsuka
Shiro Takayanagi
Yasuhiro Otsuka
Shuji Kimura
Osamu Shimoyama
Nagakawa Yukimitsu



 
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