Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
DEVELOPING TREATMENT METHOD
Document Type and Number:
Japanese Patent JPS63299337
Kind Code:
A
Abstract:

PURPOSE: To obtain a sharp resist pattern profile in a short time, by controlling the concentration of a developer and the developing speed by the use of temperature and pressure of the developer and the developer itself.

CONSTITUTION: EBR-9 is spin-coated as an electron beam resist. The EBR-9 is a resist with which a very excellent resist pattern profile can be obtained by reducing the dosage of electron beam and increasing the developing time. After electron beam exposure of the EBR-9, it is contained in a carrier and placed at a loader side. The carrier is conveyed in a developer tank 21, and a semiconductor substrate is developed with a developer 22. The temperature of the developer 22 is changed, the concentration is kept constant, and the developing speed is always kept constant. Then the carrier is put in a rinsing liquid tank. Thereby, a sharp resist pattern profile can be obtained in a short time.


Inventors:
HASHIMOTO KAZUHIKO
UENO ATSUSHI
NOMURA NOBORU
Application Number:
JP13501887A
Publication Date:
December 06, 1988
Filing Date:
May 29, 1987
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
H01L21/30; G03F7/00; G03F7/30; H01L21/027; (IPC1-7): G03C5/24; G03F7/00; H01L21/30
Attorney, Agent or Firm:
Toshio Nakao



 
Previous Patent: PATTERN FORMATION

Next Patent: PLASMA TREATMENT EQUIPMENT