Title:
DEVICE AND METHOD FOR TESTING MEMORY AND STORAGE MEDIUM
Document Type and Number:
Japanese Patent JP3171325
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To perform execution in a short time even when a memory capacity increases greatly by referring to an error information table in the start-up of a system, and performing a memory test limiting to only areas where memory errors frequently take place and an OS is loaded with a preliminarily set test pattern.
SOLUTION: An error information table 31 stored in a local memory 30 records memory error information that takes place when a system of the last time is started up and is operated. When a memory test is started, an FW refers to the table 31, analyzes in which area of a memory 20 errors frequently take place and decides a memory test area. And only such important areas where memory errors frequently take place and an OS is loaded are tested. Also, test patterns corresponding or respective areas are prepared. Thus, it is possible to reduce a memory test time and also to reduce the startup time of the entire system without lowering an error detection rate of the important areas.
Inventors:
Kayo Kuroyama
Application Number:
JP6120598A
Publication Date:
May 28, 2001
Filing Date:
March 12, 1998
Export Citation:
Assignee:
NEC
International Classes:
G06F12/16; G06F11/22; (IPC1-7): G06F12/16; G06F11/22
Domestic Patent References:
| JP3171348A | ||||
| JP3171349A | ||||
| JP9282240A | ||||
| JP2278356A | ||||
| JP480846A |
Attorney, Agent or Firm:
Johei Yamashita