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Patent Searching and Data


Title:
DOUBLE CRYSTAL SPECTROSCOPE
Document Type and Number:
Japanese Patent JPH11202096
Kind Code:
A
Abstract:

To provide a double crystal X-ray spectroscope that can control reflection and incidence angles with extremely high precision and can also effectively adapt to low incidence angles.

A double crystal spectroscope is equipped with a turn table 3, the first crystal part 4, the second crystal part 5, a main shaft drive control mechanism, a torque load detecting means and a torque load canceling mechanism 40. The turn table 3 is supported so that it can rotate on a main shaft 1 deviating from the center of gravity. In the turn table 3, an inherent torque load changes in response to the rotation angle. The first and second crystal parts 4 and 5 are respectively placed in prescribed relative positions on the turn table 3. The main shaft drive control mechanism rotates and drives the turn table 3 through the main shaft 1. The inherent torque load of the turn table 3 at an arbitrary angle is found by the torque load detecting means. The torque load canceling mechanism 40 imparts to one end of the turn table 3 additive torque load placed in the opposite direction to the inherent torque load found by the torque load detecting means. The additive torque load is imparted by the torque load canceling mechanism 40 so that all torque load of the turn table 3 can be kept an allowable value or lower.


Inventors:
TAKAGI YASUO
KIKUCHI TOSHIJI
KOZU HIROYUKI
Application Number:
JP1337498A
Publication Date:
July 30, 1999
Filing Date:
January 07, 1998
Export Citation:
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Assignee:
NIPPON STEEL CORP
KOUZU SEIKI KK
International Classes:
G21K1/06; (IPC1-7): G21K1/06
Attorney, Agent or Firm:
Kokubun Takaetsu