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Patent Searching and Data


Title:
FLUORESCENCE X-RAY ANALYZER FOR METALLIC FILM
Document Type and Number:
Japanese Patent JPS6325540
Kind Code:
A
Abstract:

PURPOSE: To enable quantitative analysis for the composition and adhesion of a metallic film such as plated film of a fused Zn-Al plated steel plate especially being transferred accurately on line, by arranging a radiation source, a plurality of detectors, an arithmetic unit and the like.

CONSTITUTION: When X rays are made to irradiate a Zn-Al plated steel plate 1 at an angle of incidence of above 60°, fluorescence X rays are generated from the Zn-Al alloy film 1a and a steel plate 1b and X rays detectors 4 and 14 or the like are provided in the course thereof. Take off angles 2 and 3 and the like are above 10° to avoid a problem of only analyzing the surface layer of the film 1a. The fluorescence X rays detected by the detectors 4 and 14 or the like are converted to electrical signals therewith to be sent to amplifiers 5 and 15 or the like respectively and then, converted to the intensity of fluorescence X rays for a specified metal element with single-channel analyzers 6 and 16, scaler timers 7 and 17 and the like. Receiving a signal inputted from the detector 4, the timer 7 applies an output signal corresponding to the intensity of fluorescence X rays to an arithmetic unit 8, which 8 calculates the adhesion of the film 1a based on the input signal.


Inventors:
MATSUMOTO YOSHIRO
Application Number:
JP16933686A
Publication Date:
February 03, 1988
Filing Date:
July 17, 1986
Export Citation:
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Assignee:
SUMITOMO METAL IND
International Classes:
G01B15/02; G01N23/223; (IPC1-7): G01B15/02; G01N23/223
Attorney, Agent or Firm:
Tono Kono