Title:
FLUORESCENT X-RAY ANALYZER
Document Type and Number:
Japanese Patent JP3219489
Kind Code:
B2
Abstract:
PURPOSE: To provide a fluorescent X-ray analyzer where analysis accuracy is improved and at the same time analysis efficiency is improved.
CONSTITUTION: The title analyzer 10 is provided with a container, a glass bead manufacturing means 3 with a heating part 12 and a cooling par 13, a measuring mean 4, a polishing means 5, and an analysis means 6. The composition powder of glass bead which is thrown into the container is dissolved by the heating part 12 and is cooled by a cooling part 13, thus judging the quality of an analysis surface since the flatness, etc., are measured by the measuring means 4 even if the flatness and smoothness of the analysis surface of the glass bead deteriorate due to deformation of the container. Then, by polishing the analysis surface of the glass bead which is judged to be faulty by a polishing means 5, an accurate analysis surface can be obtained, thus improving the analysis accuracy of the analysis means 6 and hence improving the analysis efficiency.
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Inventors:
Yasuyuki Yamamoto
Noriko Takeda
Kyoko Anan
Yutaro Yuzuhara
Noriko Takeda
Kyoko Anan
Yutaro Yuzuhara
Application Number:
JP27703592A
Publication Date:
October 15, 2001
Filing Date:
October 15, 1992
Export Citation:
Assignee:
TDK Co., Ltd.
International Classes:
G01N1/28; G01N23/223; (IPC1-7): G01N23/223; G01N1/28
Domestic Patent References:
| JP6141948A | ||||
| JP6141945A | ||||
| JP224545A | ||||
| JP57197444A | ||||
| JP1253643A | ||||
| JP328736A | ||||
| JP5056996A |
Attorney, Agent or Firm:
Masayoshi Misawa