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Patent Searching and Data


Title:
FOCUSING POINT DETECTING METHOD AND OPTICAL MICROSCOPE USING THE SAME
Document Type and Number:
Japanese Patent JP2005202092
Kind Code:
A
Abstract:

To provide a focusing method and device by which focusing is quickly performed even on a rugged sample with a plurality of focal planes and on a sample with an unclear contour.

A maximum focal position is detected by making laser slit light from laser spot light by a laser diode or the like, projecting the laser slit light onto the surface of the sample, imaging the laser slit light reflected from the sample on a line sensor arranged vertically to the optical axis via a half mirror, shifting the line sensor in the direction of the optical axis, characterizing a moving distance and a high-frequency component amount of the line sensor image, and detecting a moving distance at which the high-frequency component amount of the line sensor image is maximized.


Inventors:
KOSUGE SHOGO
OTSUKA SHIGENOBU
SHIMIZU TAKAHIRO
Application Number:
JP2004007612A
Publication Date:
July 28, 2005
Filing Date:
January 15, 2004
Export Citation:
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Assignee:
HITACHI INT ELECTRIC INC
International Classes:
G01B11/00; G02B7/28; G02B7/36; G02B21/06; G02B21/18; G02B21/24; (IPC1-7): G02B7/28; G01B11/00; G02B7/36; G02B21/06; G02B21/18; G02B21/24