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Title:
FREE-SPACE ELECTROMAGNETIC WAVE MEASURING SYSTEM AND ITS EVALUATING METHOD
Document Type and Number:
Japanese Patent JP2003287506
Kind Code:
A
Abstract:

To provide a free-space electromagnetic wave measuring system that can measure the constants of the material of a specimen to electromagnetic waves with high accuracy and can be miniaturized advantageously, and to provide a method by which the measuring system can be evaluated easily.

The free-space electromagnetic wave measuring system 100 is provided with a placing base 10 which is set up on a floor 1 and on which the specimen 2 is placed, an electromagnetic wave absorber 20 provided above the base 10, and a transmission antenna 30 provided on the base 10 and radiates electromagnetic waves toward the specimen 2. The system 100 is also provided with a reception antenna 40 which is provided on the base 10 and receives the reflected waves of the electromagnetic waves from the specimen 2 and a measuring instrument connected to the transmission and reception antennas 30 and 40.


Inventors:
KIMURA KENICHI
SHIROMIZU KOICHI
KUBO TOMOYA
Application Number:
JP2002088456A
Publication Date:
October 10, 2003
Filing Date:
March 27, 2002
Export Citation:
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Assignee:
FUJITA CORP
International Classes:
G01N22/00; H01Q17/00; (IPC1-7): G01N22/00; H01Q17/00
Attorney, Agent or Firm:
Shigeru Noda