Title:
GRAIN SIZE DISTRIBUTION-MEASURING APPARATUS AND SENSITIVITY CALIBRATION METHOD IN THE SAME
Document Type and Number:
Japanese Patent JP3866986
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a grain size distribution-measuring apparatus that is capable of calibrating quickly and accurately, and to provide a sensitivity calibration method in the grain size distribution-measuring apparatus.
SOLUTION: A grain size distribution-measuring apparatus 1 has a plurality of detectors 5 for detecting scattered light Ls that is generated by irradiating a sample S to be measured with laser beams L at each specific angle, and obtains a grain size distribution Dout in a sample S to be measured. The grain size distribution-measuring apparatus 1 has a cell 2' that has substantially the same shape as a sample cell 2 for positioning a fluorescent substance Sc at a position for installing the sample S to be measured.
Inventors:
Tatsuo Igushi
Application Number:
JP2002035288A
Publication Date:
January 10, 2007
Filing Date:
February 13, 2002
Export Citation:
Assignee:
HORIBA, Ltd.
International Classes:
G01N15/14; G01N15/02; (IPC1-7): G01N15/02; G01N15/14
Domestic Patent References:
| JP2001249131A | ||||
| JP2001174394A | ||||
| JP2000258334A | ||||
| JP2000321207A | ||||
| JP11218482A | ||||
| JP11035299A | ||||
| JP9196916A | ||||
| JP4351939A | ||||
| JP61221633A |
Other References:
清水勲,ナノ粒子の大視野計測法の開発に関する研究,第19回空気洗浄とコンタミネーションコントロール研究大会予稿集,日本,社団法人日本空気清浄協会,2001年 4月18日,Page.210-212
Attorney, Agent or Firm:
Hideo Fujimoto
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