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Title:
HERMETIC SEALING TEST METHOD
Document Type and Number:
Japanese Patent JPH07181100
Kind Code:
A
Abstract:

PURPOSE: To realize an accurate hermetic sealing test for a device sealed hermet ically with a glass based ceramic by employing a gross leak test process, a hot air blowing degassing process and a trace leak test process.

CONSTITUTION: A glass ceramic board is subjected to heating for about 30min in helium gas and sealed hermetically to produce a hermetically sealed device. A gross leak test is conducted using a leak detector. Since a gross leaked device can be determined prior to next process, i.e., trace leak test process, efficiency is enhanced in the hermetic test. A hot air circulation heating system is employed as a degassing system based on the experimental results. Since the degassing system is provided with a plurality of device set cages 7 and the time interval for throwing the cage 7 into a heating furnace 9 can be set arbitrarily, the inventive method can be applied to a case where a plurality of hermetically sealed devices having different helium gas occlusion are generated. Finally, a trace leak test process is conducted using the leak detector.


Inventors:
TAKAHASHI TAKESHI
MIURA SHINYA
KANDA KOZO
Application Number:
JP32370293A
Publication Date:
July 18, 1995
Filing Date:
December 22, 1993
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
G01M3/00; G01M3/04; G01M3/20; (IPC1-7): G01M3/20; G01M3/00; G01M3/04
Attorney, Agent or Firm:
Ogawa Katsuo



 
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